CSIR-National Physical Laboratory

सीएसआईआर-राष्ट्रीय भौतिक प्रयोगशाला

Sensor Devices & Metrology

The group is involved in the development of Solid State Gas Sensors mainly for atmospheric pollutants.

Thin Film Devices & Metrology group mainly focused on the development of thin film (metal oxide, III- nitride) based smart & reliable sensors for accurate measurement of environment pollutant gases. Extensive efforts have been put to develop solid state gas sensors for CO & NOx gases. Prototype MO based sensing device for CO gas has been designed and fabricated on alumina substrate with integrated platinum hot plate.

Further, it is essentially required that the commercially available gas sensors need to be tested and certified in order to make reliable measurements.  CSIR-NPL being the national measurement institute (NMI) will provide traceability for all the required parameters and also the calibrated gases for sensor measurements. Keeping in view of this, we are in the process of creating a National facility for testing and certification of solid state gas sensors following ISO 17025:2017.

Photoemission Spectroscopy

Plasma Assisted Molecular Beam Epitaxy

Dr. Govind
Senior Principal Scientist & DP Head
+91-11-45609503, +91-9811930735


  • Dr. M. Senthil Kumar
    Principal Scientist
    +91-11-45608609, +91-9717927838
  • Dr. Preetam Singh
    Principal Scientist

Technical Support

  • Mr. Lalit Goswami, Technical Officer
  • Mr. Saket Vihari, Technician
  • Ms. Kamla, Work Assistant
A. Characterization Equipments

Description: A multiprobe surface analysis system (Scienta Omicron, Germany) was used for X-ray & Ultraviolet photoemission spectroscopic (XPS/UPS) measurements as shown in Figure 2. The system is equipped non-monochromatized (AlK, MgK), monochromatized (AlK)) and a helium discharge lamp (He(I) & He(II)) for UPS measurements. The system also equipped with a charge neutralization gun, sputter gun to eliminate the build-up charges and surface preparation before measurements, respectively. The system also contains microscopic techniques such as Scanning Tunneling Microscopy and Atomic Force Microscopy (RT to 100K). Besides this, the system also has techniques such as Auger Electron spectroscopy, Scanning electron spectroscopy and Temperature Programmed Desorption.